- Auger/XPS/SIMS Facility
- Scanning Electron Microscopy
- Transmission Electron Microscopy
- Ambient Atomic Force/Electrostatic Force Microscopy
- UHV Variable Temperature Scanning Tunneling Microscopy
- Near Field Scanning Optical Microscopy
- Spectroscopic Ellipsometry
- Fourier Transform Infrared Spectroscopy
- Visible and Infrared Spectroscopy Facilities
- Argon, Excimer, and Tunable Dye Laser Sources
- Solar Test Station with Solar Simulator, Spectral Response, and Suns VOC
- Near-Infrared Fiber-Coupled Waveguide Test Station