Characterization

  • Auger/XPS/SIMS Facility
  • Scanning Electron Microscopy
  • Transmission Electron Microscopy
  • Ambient Atomic Force/Electrostatic Force Microscopy
  • UHV Variable Temperature Scanning Tunneling Microscopy
  • Near Field Scanning Optical Microscopy
  • Spectroscopic Ellipsometry
  • Fourier Transform Infrared Spectroscopy
  • Visible and Infrared Spectroscopy Facilities
  • Argon, Excimer, and Tunable Dye Laser Sources
  • Solar Test Station with Solar Simulator, Spectral Response, and Suns VOC
  • Near-Infrared Fiber-Coupled Waveguide Test Station